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Citation

BibTex format

@article{Dong:2019:1882-0786/ab3e51,
author = {Dong, X and Dong, J and Yetisen, AK and Koehler, MH and Wang, S and Jakobi, M and Koch, AW},
doi = {1882-0786/ab3e51},
journal = {APPLIED PHYSICS EXPRESS},
title = {Characterization and layer thickness mapping of two-dimensional MoS2 flakes via hyperspectral line-scanning microscopy},
url = {http://dx.doi.org/10.7567/1882-0786/ab3e51},
volume = {12},
year = {2019}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AU  - Dong,X
AU  - Dong,J
AU  - Yetisen,AK
AU  - Koehler,MH
AU  - Wang,S
AU  - Jakobi,M
AU  - Koch,AW
DO  - 1882-0786/ab3e51
PY  - 2019///
SN  - 1882-0778
TI  - Characterization and layer thickness mapping of two-dimensional MoS2 flakes via hyperspectral line-scanning microscopy
T2  - APPLIED PHYSICS EXPRESS
UR  - http://dx.doi.org/10.7567/1882-0786/ab3e51
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000484527100004&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
VL  - 12
ER  -
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