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BibTex format

@article{Dong:2020:1882-0786/ab88c7,
author = {Dong, X and Yetisen, AK and Tian, H and Dong, J and Koehler, MH and Jakobi, M and Koch, AW},
doi = {1882-0786/ab88c7},
journal = {APPLIED PHYSICS EXPRESS},
title = {Analyses of hyperspectral imaging microscopy data sets of semiconducting 2D materials},
url = {http://dx.doi.org/10.35848/1882-0786/ab88c7},
volume = {13},
year = {2020}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AU  - Dong,X
AU  - Yetisen,AK
AU  - Tian,H
AU  - Dong,J
AU  - Koehler,MH
AU  - Jakobi,M
AU  - Koch,AW
DO  - 1882-0786/ab88c7
PY  - 2020///
SN  - 1882-0778
TI  - Analyses of hyperspectral imaging microscopy data sets of semiconducting 2D materials
T2  - APPLIED PHYSICS EXPRESS
UR  - http://dx.doi.org/10.35848/1882-0786/ab88c7
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000529895600001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
VL  - 13
ER  -
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